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Phys. Rev. 59, 693–698 (1941)

X-Ray Diffraction in Random Layer Lattices

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B. E. Warren
George Eastman Laboratory of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts

Received 7 March 1941; published in the issue dated May 1941

Random layer lattice structures are considered which consist of layers arranged parallel and equidistant, but random in translation parallel to the layer, and rotation about the normal. We call a and b the axes in the layer, and c the axis normal to the layer. In this notation there will be crystalline reflections of type (00l), two-dimensional lattice reflections of type (hk), and no general reflections (hkl). Equations are developed for the intensity distribution in a two-dimensional powder reflection, and for the integrated intensity. Equations are also de-developed for the particle size in terms of the peak breadth, and for the displacement of the peak. The powder pattern of a heat treated carbon black is presented as an illustration of two-dimensional lattice reflections.

© 1941 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRev.59.693
DOI:
10.1103/PhysRev.59.693
PACS: