Phys. Rev. 70, 229 - 229 (1946)

Note on Thickness of Quartz Wafers for Observed Surface Phenomena

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D. D'eustachio
Bliley Manufacturing Corporation, Erie, Pennsylvania

Received 16 July 1946

©1946 The American Physical Society

URL: http://link.aps.org/abstract/PR/v70/p229
DOI: 10.1103/PhysRev.70.229