Phys. Rev. B 31, 3593 - 3598 (1985)

Scanning tunneling microscope as a structure-modifying tool

Download: Page Images , PDF (1060 kB), or Buy this Article (Use Article Pack) Export: BibTeX or EndNote (RIS)

H. H. Farrell
Bell Communications Research, Murray Hill, New Jersey 07974

M. Levinson
AT&T Bell Laboratories, Murray Hill, New Jersey 07974

Received 13 December 1984

We explore the possibility that surface charge induced by the scanning tunneling microscope will influence the structure of the surface under investigation. In general, we find that the emission currents limit the induced charge densities and preclude major structural modifications on the more stable surfaces. However, the possibility of modifying less stable structures or of reducing the transition temperatures for transformation between different surface phases does exist and is discussed in detail.


©1985 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v31/p3593
DOI: 10.1103/PhysRevB.31.3593
PACS: 79.70.+q, 73.20.-r

[ Abstract  |  Previous article  |  Next article  |  Issue 6 ]