APS » PROLA » Phys. Rev. B » Volume 31 » Issue 6

Phys. Rev. B 31, 3599 - 3605 (1985)

Determination of anomalous scattering factors in GaAs using x-ray refraction through a prism
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A. Fontaine and W. K. Warburton
Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center Bin 69, P.O. Box 4349, Stanford, California 94305

K. F. Ludwig, Jr.
Department of Applied Physics, Stanford University, Stanford, California 94305

Received 15 October 1984

The advantages of synchrotron radiation have been employed to revitalize a 60-year-old technique for measuring anomalous scattering factors by accurately measuring x-ray refraction through a prism. We report results obtained from a GaAs sample in the vicinity of both the Ga and As K absorption edges. Our analysis of the technique shows that relative accuracies of 0.03 electrons and absolute accuracies of 0.1 electrons should be readily obtainable. This should be adequate for the needs of anomalous x-ray scattering measurements.


©1985 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v31/p3599
DOI: 10.1103/PhysRevB.31.3599
PACS: 78.20.Dj, 78.70.Ck, 78.70.Dm

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