Phys. Rev. B 52, 4477 - 4480 (1995)Microwave surface impedance of proximity-coupled Nb/Al bilayer films |
Michael S. Pambianchi, S. N. Mao, and Steven M. Anlage
Center for Superconductivity Research, Department of Physics, University of Maryland, College Park, Maryland 20742-4111
Received 16 February 1995
The surface resistance and magnetic penetration depth in proximity-coupled superconductor/normal-metal (Nb/Al) bilayers are examined to study the electrodynamics of layered structures with spatially inhomogeneous superconducting order parameter. The effective penetration depth λeff(T) obeys Δλeff(T)∼Tn, where n≤1, at low temperatures, distinctly different from the exponential behavior of Nb. An accompanying drop in the surface resistance Rs occurs in the same temperature range. A model of the bilayer electrodynamics explicitly including the effects of proximity coupling is developed, and the behavior of both λeff and Rs is consistently described. We find that a treatment of coherence effects in the proximity-coupled normal-metal layer is necessary to properly describe the behavior of Rs(T).
©1995 The American Physical Society
URL: http://link.aps.org/abstract/PRB/v52/p4477
DOI: 10.1103/PhysRevB.52.4477
PACS: 74.50.+r, 74.25.Nf, 74.80.Dm
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