Phys. Rev. B 55, R15989 - R15992 (1997)

X-ray L2,3 resonant Raman scattering from NiO: Spin flip and intermediate-state relaxation

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L. Braicovich, C. Dallera, and G. Ghiringhelli
INFM, Dipartimento di Fisica del Politecnico, Piazza Leonardo da Vinci 32, 20133 Milano, Italy

N. B. Brookes, J. B. Goedkoop, and M. A. van Veenendaal
ESRF, European Synchrotron Radiation Facility, Grenoble, Boîte Postale 220, F-38043 France

Rapid Communication

We present measurements of x-ray resonant Raman scattering from NiO with L2,3 excitation and calculations in an ionic model based on the process (2p63s23d8)→(2p53s23d9)→(2p63s13d9). The agreement between theory and experiment is good from below threshold up to 2.5–3 eV above threshold. By comparing theory and experiment, we show the effect of crystal-field splitting and the contribution bringing the Ni2+ triplet ground state to a singlet final state with excitation above the L3 edge. When the excitation energy exceeds the L3 threshold by about 3 eV, we present evidence that the intermediate state in the scattering can also relax to a state similar to that created with threshold excitation. We suggest d-d excitation and electron-hole pair excitation as the origin of this relaxation.


©1997 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevB.55.R15989
DOI: 10.1103/PhysRevB.55.R15989
PACS: 78.70.En, 78.70.Ck

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