Phys. Rev. B 56, 12092 - 12095 (1997)

Ultrafast electron transport in layered semiconductors studied with femtosecond-laser photoemission

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Armin Rettenberger and Paul Leiderer
Universität Konstanz, Fakultät für Physik, D-78434 Konstanz, Germany

Matthias Probst and Richard Haight
IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598

Received 5 May 1997

Femtosecond-laser photoemission was used to investigate the electron dynamics in the layered semiconductors MoSe2 and WSe2. Photoexcitation with 200-fs pulses of 2.03 eV light creates an electron gas with significant excess energy. Our measurements reveal a strong transient enhancement in the diffusive transport of the most energetic electrons relative to the conduction-band minimum. Additionally, we demonstrate that the surfaces of these layered chalcogenides are electronically passivated and we give an upper bound for the density of defect states within the band gap.


©1997 The American Physical Society

URL: http://link.aps.org/abstract/PRB/v56/p12092
DOI: 10.1103/PhysRevB.56.12092
PACS: 72.20.-i, 78.47.+p, 79.60.-i

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