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Phys. Rev. B 56, 1529 - 1539 (1997)

Multiple energy x-ray holography: Incident-radiation polarization effects

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P. M. Len
Physics Department, University of California, Davis, California 95616

T. Gog
Oak Ridge National Laboratory at the National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973

D. Novikov
Hamburger Synchrotronstrahlungslabor HASYLAB am Deutsches Elektronen-Synchrotron DESY, 22603 Hamburg, Germany

R. A. Eisenhower
Oak Ridge National Laboratory at the National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973

G. Materlik
Hamburger Synchrotronstrahlungslabor HASYLAB am Deutsches Elektronen-Synchrotron DESY, 22603 Hamburg, Germany

C. S. Fadley
Physics Department, University of California, Davis, California 95616
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720

Received 21 November 1996; revised 12 February 1997

Multiple energy x-ray holography (MEXH) measures both phase and amplitude information for x rays scattered from an incident reference beam, from which three-dimensional atomic images can be directly reconstructed. The angular distribution of the x-ray scattering is highly dependent on the polarization direction via the Thomson scattering cross section. We consider here the effect of incident x-ray polarization on images of Fe atoms reconstructed from theoretical and experimental MEXH data for α-Fe2O3(001) (hematite). We also illustrate such polarization effects theoretically in the enhancement of specific atomic structural information of ideal Fe trimers, and a Ge δ-layer buried in Si(001), where the use of different polarization modes and experimental geometries is found to strongly influence atomic images.


©1997 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevB.56.1529
DOI: 10.1103/PhysRevB.56.1529
PACS: 61.10.-i, 61.14.-x

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