Phys. Rev. B 57, R4281 - R4284 (1998)Application of x-ray direct methods to surface reconstructions: The solution of projected superstructures |
X. Torrelles and J. Rius
Institut de Ciència de Materials de Barcelona (C.S.I.C.), 08193 Bellaterra, Catalunya, Spain
F. Boscherini
Istituto Nazionale de Fisica Nucleare, Laboratori Nazionali di Frascati, P.O. Box 13, I-00044 Frascati (Roma), Italy
S. Heun and B. H. Mueller
Laboratorio TASC-INFM, Padriciano 99, 34012 Trieste, Italy
S. Ferrer and J. Alvarez
European Synchrotron Radiation Facility, Boîte Postale 220, 38043 Grenoble Cedex, France
C. Miravitlles
Institut de Ciència de Materials de Barcelona (C.S.I.C.), 08193 Bellaterra, Catalunya, Spain
Received 4 November 1997
The projections of surface reconstructions are normally solved from the interatomic vectors found in two-dimensional Patterson maps computed with the intensities of the in-plane superstructure reflections. Since for difficult reconstructions this procedure is not trivial, an alternative automated one based on the “direct methods” sum function [Rius, Miravitlles, and Allmann, Acta Crystallogr. A52, 634 (1996)] is shown. It has been applied successfully to the known c(4×2) reconstruction of Ge(001) and to the so-far unresolved In0.04Ga0.96As (001) p(4×2) surface reconstruction. For this last system we propose a modification of one of the models previously proposed for GaAs(001) whose characteristic feature is the presence of dimers along the fourfold direction.
©1998 The American Physical Society
URL: http://link.aps.org/abstract/PRB/v57/pR4281
DOI: 10.1103/PhysRevB.57.R4281
PACS: 68.35.Bs, 61.18.-j
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