Phys. Rev. Lett. 73, 1785 - 1788 (1994)Semiconductor Microlaser Linewidths |
U. Mohideen and R. E. Slusher
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
F. Jahnke and S. W. Koch
Optical Science Center, University of Arizona, Tucson, Arizona 85721
Received 2 November 1993
Semiconductor microdisk laser linewidths are measured for cavity volumes near a cubic wavelength. The linewidths remain near the subthreshold values for pump powers well above threshold in agreement with a microscopic theory that includes the coupled dynamics of the optical emission and the nonequilibrium electron-hole gas in the cavity.
©1994 The American Physical Society
URL: http://link.aps.org/abstract/PRL/v73/p1785
DOI: 10.1103/PhysRevLett.73.1785
PACS: 42.55.Px, 78.45.+h, 78.55.Cr
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