Phys. Rev. Lett. 73, 2724 - 2727 (1994)

Muonium Centers in Crystalline Si and Ge under Illumination

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R. Kadono1, A. Matsushita1, R. M. Macrae1, K. Nishiyama2, and K. Nagamine1,2
1The Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351-01, Japan
2Meson Science Laboratory, Faculty of Science, University of Tokyo, Tokyo 113, Japan

Received 6 June 1994

The charged state of implanted positive muons, Mu±, formed at high temperatures undergoes fast spin relaxation in both Si and Ge under illumination due to a cyclic charge-exchange reaction with photoinduced carriers. In Si, the neutral tetrahedral interstitial muonium state (MuT0) also collides effectively with carriers to induce reaction, while in Ge the neutral state is unreactive. In particular, in Si at low temperatures, the MuBC0 center is rapidly converted into bond center muonium (MuT0) with supervening fast spin relaxation under illumination.


©1994 The American Physical Society

URL: http://link.aps.org/abstract/PRL/v73/p2724
DOI: 10.1103/PhysRevLett.73.2724
PACS: 66.30.Jt, 61.72.Vv, 61.72.Yx, 76.75.+i

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