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Phys. Rev. Lett. 81, 5832 - 5835 (1998)

Coherent X-Ray Study of Fluctuations during Domain Coarsening

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A. Malik1, A. R. Sandy2, L. B. Lurio2, G. B. Stephenson1, S. G. J. Mochrie2, I. McNulty3, and M. Sutton4
1Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
2Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
3Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
4Physics Department, McGill University, Montreal, Quebec H3A 2T8 Canada

Received 5 August 1998

We report observations of the dynamics of the exact structure factor (speckle pattern) during phase separation in a sodium borosilicate glass, measured using intensity fluctuation spectroscopy with a coherent x-ray beam. Nonequilibrium fluctuations in the structure factor are analyzed using a two-time correlation function to extract the time-dependent and wave-number-dependent correlation time. The behavior of the correlation time is in agreement with a scaling law previously found in simulations.


©1998 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevLett.81.5832
DOI: 10.1103/PhysRevLett.81.5832
PACS: 61.10.Eq, 64.60.-i, 64.75.+g

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