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Phys. Rev. Lett. 87, 140801 (2001) [4 pages]

Characterization of the Transverse Coherence of Hard Synchrotron Radiation by Intensity Interferometry

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M. Yabashi1, K. Tamasaku2, and T. Ishikawa1,2
1SPring-8/JASRI, Mikazuki, Hyogo 679-5198, Japan
2SPring-8/RIKEN, Mikazuki, Hyogo 679-5148, Japan

Received 20 June 2001; published 14 September 2001

The transverse coherence of x rays was measured with an intensity interferometer using a 120-μeV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as well as the coherence degradation by a phase object in the beam path, were quantitatively characterized.


©2001 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevLett.87.140801
DOI: 10.1103/PhysRevLett.87.140801
PACS: 07.85.Qe, 41.50.+h, 42.50.-p

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