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Phys. Rev. Lett. 88, 244801 (2002) [4 pages]

Measurement of X-Ray Pulse Widths by Intensity Interferometry

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M. Yabashi1, K. Tamasaku2, and T. Ishikawa1,2
1SPring-8/JASRI, Mikazuki, Hyogo 679-5198, Japan
2SPring-8/RIKEN, Mikazuki, Hyogo 679-5148, Japan

Received 8 April 2002; published 31 May 2002

The pulse width of hard undulator radiation (32 ps width, energy 14 keV) was determined by intensity interferometry. The method, in combination with various x-ray monochromators, enables measurements to be taken over a wide range of time frames, from ns to fs. The applicable target includes measurements of ultrafast x-ray pulse widths from fourth generation synchrotron light sources.


©2002 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevLett.88.244801
DOI: 10.1103/PhysRevLett.88.244801
PACS: 41.50.+h, 07.85.Qe, 42.50.-p

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