Physical Review Letters
– 4 February 2002
Volume 88, Issue 5
Electric field strength around a field-emitting carbon nanotube measured by electron holography. As electrons in an imaging beam are scattered by the nanotube, they acquire a phase shift due to the varying potential. A measurement of this shift therefore gives the electric potential, and the gradient of the phase shift (depicted in the image) shows the field strength.
[John Cumings, A. Zettl, M. R. McCartney, and J. C. Spence, Phys. Rev. Lett. 88, 056804 (2002)]
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